Cite
Efficient Feature Selection-Based on Random Forward Search for Virtual Metrology Modeling.
MLA
Kang, Seokho, et al. “Efficient Feature Selection-Based on Random Forward Search for Virtual Metrology Modeling.” IEEE Transactions on Semiconductor Manufacturing, vol. 29, no. 4, Nov. 2016, pp. 391–98. EBSCOhost, https://doi.org/10.1109/TSM.2016.2594033.
APA
Kang, S., Kim, D., & Cho, S. (2016). Efficient Feature Selection-Based on Random Forward Search for Virtual Metrology Modeling. IEEE Transactions on Semiconductor Manufacturing, 29(4), 391–398. https://doi.org/10.1109/TSM.2016.2594033
Chicago
Kang, Seokho, Dongil Kim, and Sungzoon Cho. 2016. “Efficient Feature Selection-Based on Random Forward Search for Virtual Metrology Modeling.” IEEE Transactions on Semiconductor Manufacturing 29 (4): 391–98. doi:10.1109/TSM.2016.2594033.