Cite
Influence of the nucleation layer morphology on the structural property of AlN films grown on c-plane sapphire by MOCVD.
MLA
Luo, Weike, et al. “Influence of the Nucleation Layer Morphology on the Structural Property of AlN Films Grown on C-Plane Sapphire by MOCVD.” Journal of Alloys & Compounds, vol. 697, Mar. 2017, pp. 262–67. EBSCOhost, https://doi.org/10.1016/j.jallcom.2016.12.126.
APA
Luo, W., Li, L., Li, Z., Yang, Q., Zhang, D., Dong, X., Peng, D., Pan, L., Li, C., Liu, B., & Zhong, R. (2017). Influence of the nucleation layer morphology on the structural property of AlN films grown on c-plane sapphire by MOCVD. Journal of Alloys & Compounds, 697, 262–267. https://doi.org/10.1016/j.jallcom.2016.12.126
Chicago
Luo, Weike, Liang Li, Zhonghui Li, Qiankun Yang, Dongguo Zhang, Xun Dong, Daqing Peng, et al. 2017. “Influence of the Nucleation Layer Morphology on the Structural Property of AlN Films Grown on C-Plane Sapphire by MOCVD.” Journal of Alloys & Compounds 697 (March): 262–67. doi:10.1016/j.jallcom.2016.12.126.