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Introducing Optical Cascode GaN HEMT.

Authors :
Mojab, Alireza
Hemmat, Zahra
Riazmontazer, Hossein
Rahnamaee, Arash
Source :
IEEE Transactions on Electron Devices. Mar2017, Vol. 64 Issue 3, p796-804. 9p.
Publication Year :
2017

Abstract

A novel optically activated cascode gallium nitride (GaN) high-electron-mobility transistor (HEMT) is introduced and evaluated in this paper. Furthermore, optical triggering of GaN HEMT structures by cost-effective and high-power long-wavelength light sources is proposed for the first time. In electrical domain, GaN HEMTs suffer from being normally on devices, making it more complicated to design and implement gate drivers for these devices. In optical domain, GaN devices suffer from being triggered by low-power short-wavelength light sources, making them significantly more expensive and practically unprofitable. Therefore, a new optical cascode (OC) GaN HEMT is proposed in this paper to solve the problems of both electrical and optical domains. The structure of this OC GaN HEMT includes a high-power normally on (depletion mode) GaN HEMT in combination with a low-power optical switch in cascode configuration. This OC not only realizes an overall normally off (enhancementmode) structure, but also offers activationwith cost-effective long-wavelength optical sources. It also offers a single-biased configurationwithout the need for complicated electrical gate drivers. Unlike conventional electrically activated cascode GaN HEMT structures, which may be prone to electromagnetic interference noise due to the high-frequency switching operation, the optical link in this proposed scheme is immune to external noise. The results showa high-frequency switching capability of 1MHz for theOCGaN HEMT under a bias voltage of 600 V and a current of 10 A. Less voltage and current ringing are observed in the OC compared with the electrical alternative due to the elimination of gate controlling inductance introduced in the electrical cascode configuration. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
64
Issue :
3
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
121551510
Full Text :
https://doi.org/10.1109/TED.2017.2657498