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Reduction of Die-Bonding Interface Thermal Resistance for High-Power LEDs Through Embedding Packaging Structure.

Authors :
Lei, Xiang
Zheng, Huai
Guo, Xing
Zhang, Zefeng
Wu, Jiading
Xu, Chunlin
Liu, Sheng
Source :
IEEE Transactions on Power Electronics. Jul2017, Vol. 32 Issue 7, p5520-5526. 7p.
Publication Year :
2017

Abstract

Thermal management is a key issue for high-power light-emitting diodes (LEDs). In this study, a novel packaging structure was proposed to reduce the die-bonding interface thermal resistance and provided a new idea for LED heat-dissipation. The LED chip was embedded into a square groove at the lead-frame substrate. The gap between the edges of the LED chip and square groove was filled with boron nitride/silicone composite. So the heat generated from the chip could be dissipated from the side surfaces to the substrate. The experimental results show that the heat-dissipation ability of LEDs has been significantly improved by the new embedding packaging structure. The die-bonding interface thermal resistance can be reduced by more than 20%. The junction temperature rise can be reduced by 14%. Due to the fully embedding of LED chip in the square groove, the light intensity distribution is slightly shrunk and the light output power is slightly reduced by about 8%. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
08858993
Volume :
32
Issue :
7
Database :
Academic Search Index
Journal :
IEEE Transactions on Power Electronics
Publication Type :
Academic Journal
Accession number :
121563562
Full Text :
https://doi.org/10.1109/TPEL.2016.2609891