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Response Variability in Commercial MOSFET SEE Qualification.
- Source :
-
IEEE Transactions on Nuclear Science . Jan2017, Vol. 64 Issue 1, part 1, p317-324. 8p. - Publication Year :
- 2017
-
Abstract
- Single-event effects (SEE) evaluation of five different part types of next generation, commercial trench MOSFETs indicates large part-to-part variation in determining a safe operating area (SOA) for drain-source voltage ( \text V\mathrm { {DS}} ) following a test campaign that exposed >50 samples per part type to heavy ions. These results suggest a determination of a SOA using small sample sizes may fail to capture the full extent of the part-to-part variability. An example method is discussed for establishing a Safe Operating Area using a one-sided statistical tolerance limit based on the number of test samples. Burn-in is shown to be a critical factor in reducing part-to-part variation in part response. Implications for radiation qualification requirements are also explored. [ABSTRACT FROM PUBLISHER]
Details
- Language :
- English
- ISSN :
- 00189499
- Volume :
- 64
- Issue :
- 1, part 1
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- 121745574
- Full Text :
- https://doi.org/10.1109/TNS.2016.2633358