Single-Event Characteristics for Voltage Dips in Three-Phase Systems.

This paper compares different methods for voltage-dip characterization. Those methods are based on earlier proposed algorithms for extracting three-phase characteristics (dip type, characteristic voltage, and so-called “PN factor”). The difference between the 12 methods being studied in this paper is in the way in which the time variation of those characteristics is treated to result in single-event characteristics. The methods are applied to 259 measured voltage dips, and the performance of the different methods is compared. It is found that small differences in the method can result in big differences in results. From the comparison, two methods are selected and recommended for inclusion in international standards. [ABSTRACT FROM PUBLISHER]