Applications of fractional lower order S transform time frequency filtering algorithm to machine fault diagnosis.

Stockwell transform(ST) time-frequency representation(ST-TFR) is a time frequency analysis method which combines short time Fourier transform with wavelet transform, and ST time frequency filtering(ST-TFF) method which takes advantage of time-frequency localized spectra can separate the signals from Gaussian noise. The ST-TFR and ST-TFF methods are used to analyze the fault signals, which is reasonable and effective in general Gaussian noise cases. However, it is proved that the mechanical bearing fault signal belongs to Alpha(α) stable distribution process(1 < α < 2) in this paper, even the noise also is α stable distribution in some special cases. The performance of ST-TFR method will degrade under α stable distribution noise environment, following the ST-TFF method fail. Hence, a new fractional lower order ST time frequency representation(FLOST-TFR) method employing fractional lower order moment and ST and inverse FLOST(IFLOST) are proposed in this paper. A new FLOST time frequency filtering(FLOST-TFF) algorithm based on FLOST-TFR method and IFLOST is also proposed, whose simplified method is presented in this paper. The discrete implementation of FLOST-TFF algorithm is deduced, and relevant steps are summarized. Simulation results demonstrate that FLOST-TFR algorithm is obviously better than the existing ST-TFR algorithm under α stable distribution noise, which can work better under Gaussian noise environment, and is robust. The FLOST-TFF method can effectively filter out α stable distribution noise, and restore the original signal. The performance of FLOST-TFF algorithm is better than the ST-TFF method, employing which mixed MSEs are smaller when α and generalized signal noise ratio(GSNR) change. Finally, the FLOST-TFR and FLOST-TFF methods are applied to analyze the outer race fault signal and extract their fault features under α stable distribution noise, where excellent performances can be shown. [ABSTRACT FROM AUTHOR]