Topological instability of the ferroelectric domain wall caused by screening retardation.

In this paper, we established the origin of the experimentally observed topological instability representing the change of the plane domain wall shape by formation of so-called “fingers” during fast polarization reversal of the ferroelectric capacitor. By means of a simplified model we show that the topological instability of the domain wall can be attributed to retardation of the bulk screening of residual depolarization field. [ABSTRACT FROM PUBLISHER]