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A comprehensive study of SHI irradiated fullerene C60 thin films: Polymerization to amorphization.

Authors :
Sharma, P.
Singhal, R.
Vishnoi, R.
Banerjee, M.K.
Avasthi, D.K.
Source :
Synthetic Metals. May2017, Vol. 227, p93-99. 7p.
Publication Year :
2017

Abstract

Fullerene C 60 thin films with a thickness of ∼120 nm were synthesized by thermal evaporation method on glass substrate. The deposited thin films are irradiated with 90 MeV Ni ions in the fluence range from 1 × 10 9 to 3 × 10 13 ions/cm 2 . The pristine and irradiated fullerene C 60 thin films are examined to study the effect of energy deposition by 90 MeV Ni ions on the optical and structural properties by UV–visible absorbance spectroscopy and Raman spectroscopy, respectively. UV–visible absorbance spectroscopy study reveals that the absorbance peaks decline with the fluence and at particular fluence (∼3 × 10 13 ions/cm 2 ) all the absorbance peaks disappear. Apart from this, a decrease in band gap has also been observed with increasing fluence. Raman study confirms that the effect of 90 MeV Ni ion irradiation is observed in two phases. In the lower fluence region, polymerization of C 60 molecules is observed and in higher fluence region, destruction of the molecules comes into picture. At fluence 3 × 10 13 ions/cm 2 , fullerene C 60 thin film transformed into amorphous carbon (a-C). The transformation of fullerene into a-C is also confirmed through conductivity measurement. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
03796779
Volume :
227
Database :
Academic Search Index
Journal :
Synthetic Metals
Publication Type :
Academic Journal
Accession number :
122646155
Full Text :
https://doi.org/10.1016/j.synthmet.2017.03.007