Cite
Testing of stuck-open faults in generalised Reed--Muller and EXOR sum-of-products CMOS circuits.
MLA
Rahaman, H., et al. “Testing of Stuck-Open Faults in Generalised Reed--Muller and EXOR Sum-of-Products CMOS Circuits.” IEE Proceedings -- Computers & Digital Techniques, vol. 151, no. 1, Jan. 2004, pp. 83–91. EBSCOhost, https://doi.org/10.1049/ip-cdt:20040031.
APA
Rahaman, H., Das, D. K., & Bhattacharya, B. B. (2004). Testing of stuck-open faults in generalised Reed--Muller and EXOR sum-of-products CMOS circuits. IEE Proceedings -- Computers & Digital Techniques, 151(1), 83–91. https://doi.org/10.1049/ip-cdt:20040031
Chicago
Rahaman, H., D.K. Das, and B.B. Bhattacharya. 2004. “Testing of Stuck-Open Faults in Generalised Reed--Muller and EXOR Sum-of-Products CMOS Circuits.” IEE Proceedings -- Computers & Digital Techniques 151 (1): 83–91. doi:10.1049/ip-cdt:20040031.