Cite
Modeling and understanding of the thermal failure induced by high power microwave in CMOS inverter.
MLA
Yu-Hang Zhang, et al. “Modeling and Understanding of the Thermal Failure Induced by High Power Microwave in CMOS Inverter.” Chinese Physics B, vol. 26, no. 5, May 2017, p. 1. EBSCOhost, https://doi.org/10.1088/1674-1056/26/5/058502.
APA
Yu-Hang Zhang, Chang-Chun Chai, Yang Liu, Yin-Tang Yang, Chun-Lei Shi, Qing-Yang Fan, & Yu-Qian Liu. (2017). Modeling and understanding of the thermal failure induced by high power microwave in CMOS inverter. Chinese Physics B, 26(5), 1. https://doi.org/10.1088/1674-1056/26/5/058502
Chicago
Yu-Hang Zhang, Chang-Chun Chai, Yang Liu, Yin-Tang Yang, Chun-Lei Shi, Qing-Yang Fan, and Yu-Qian Liu. 2017. “Modeling and Understanding of the Thermal Failure Induced by High Power Microwave in CMOS Inverter.” Chinese Physics B 26 (5): 1. doi:10.1088/1674-1056/26/5/058502.