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Evidences of areal switching in Vacancy-Modulated Conductive Oxide (VMCO) memory.

Authors :
Celano, Umberto
Gastaldi, Carlotta
Govoreanu, Bogdan
Richard, Olivier
Bender, Hugo
Goux, Ludovic
Kar, Gouri Sankar
Vandervorst, Wilfried
Source :
Microelectronic Engineering. Jun2017, Vol. 178, p122-124. 3p.
Publication Year :
2017

Abstract

In this work, we observe the switching mechanisms in non-filamentary resistive switching (RS) devices, investigated through a nanosized conductive tip used as a movable (virtual) top-electrode. The correlation between different conductive states of vacancy-modulated conductive oxide (VMCO) cells and the conductive domains in thin TiO 2 is provided. We observe the appearance of uniformly distributed conductive spots whose conductance can be reversibly modulated using a scanning biased conductive tip. Although TiO 2 has been often used as a material system for filamentary RS, these results clearly demonstrate the non-filamentary switching nature of valence change memory (VCM) cells. This supports their strong potentials in the area of applications where aggressive scaling and low-current operation is required. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
01679317
Volume :
178
Database :
Academic Search Index
Journal :
Microelectronic Engineering
Publication Type :
Academic Journal
Accession number :
123629094
Full Text :
https://doi.org/10.1016/j.mee.2017.04.046