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Carbon nanotube transistors scaled to a 40-nanometer footprint.

Authors :
Qing Cao
Tersoff, Jerry
Farmer, Damon B.
Yu Zhu
Shu-Jen Han
Source :
Science. 6/30/2017, Vol. 356 Issue 6345, p1369-1372. 4p. 1 Color Photograph, 2 Graphs.
Publication Year :
2017

Abstract

The International Technology Roadmap for Semiconductors challenges the device research community to reduce the transistor footprint containing all components to 40 nanometers within the next decade. We report on a p-channel transistor scaled to such an extremely small dimension. Built on one semiconducting carbon nanotube, it occupies less than half the space of leading silicon technologies, while delivering a significantly higher pitch-normalized current density—above 0.9 milliampere per micrometer at a low supply voltage of 0.5 volts with a subthreshold swing of 85millivolts per decade. Furthermore,we show transistors with the same small footprint built on actual high-density arrays of such nanotubes that deliver higher current than that of the best-competing silicon devices under the same overdrive,without any normalization. We achieve this using low-resistance end-bonded contacts, a high-purity semiconducting carbon nanotube source, and self-assembly to pack nanotubes into full surface-coverage aligned arrays. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00368075
Volume :
356
Issue :
6345
Database :
Academic Search Index
Journal :
Science
Publication Type :
Academic Journal
Accession number :
123879183
Full Text :
https://doi.org/10.1126/science.aan2476