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Computer Engineers' Challenges for the Next Decade: The Triangle of Power Density, Circuit Degradation, and Reliability.

Authors :
Henkel, Jorg
Montuschi, Paolo
Source :
Computer (00189162). Jul2017, Vol. 50 Issue 7, p12-12. 1p.
Publication Year :
2017

Abstract

This installment of Computer's series highlighting the work published in IEEE Computer Society journals comes from IEEE Transactions on Computers. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189162
Volume :
50
Issue :
7
Database :
Academic Search Index
Journal :
Computer (00189162)
Publication Type :
Academic Journal
Accession number :
124027596
Full Text :
https://doi.org/10.1109/MC.2017.214