Cite
Reliable Time Exponents for Long Term Prediction of Negative Bias Temperature Instability by Extrapolation.
MLA
Gao, Rui, et al. “Reliable Time Exponents for Long Term Prediction of Negative Bias Temperature Instability by Extrapolation.” IEEE Transactions on Electron Devices, vol. 64, no. 4, Apr. 2017, pp. 1467–73. EBSCOhost, https://doi.org/10.1109/TED.2017.2669644.
APA
Gao, R., Manut, A. B., Ji, Z., Ma, J., Duan, M., Zhang, J. F., Franco, J., Hatta, S. W. M., Zhang, W. D., Kaczer, B., Vigar, D., Linten, D., & Groeseneken, G. (2017). Reliable Time Exponents for Long Term Prediction of Negative Bias Temperature Instability by Extrapolation. IEEE Transactions on Electron Devices, 64(4), 1467–1473. https://doi.org/10.1109/TED.2017.2669644
Chicago
Gao, Rui, Azrif B. Manut, Zhigang Ji, Jigang Ma, Meng Duan, Jian Fu Zhang, Jacopo Franco, et al. 2017. “Reliable Time Exponents for Long Term Prediction of Negative Bias Temperature Instability by Extrapolation.” IEEE Transactions on Electron Devices 64 (4): 1467–73. doi:10.1109/TED.2017.2669644.