Cite
Effect of Carrier Localization on Electrical Transport and Noise at Individual Grain Boundaries in Monolayer MoS2.
MLA
Hsieh, Kimberly, et al. “Effect of Carrier Localization on Electrical Transport and Noise at Individual Grain Boundaries in Monolayer MoS2.” Nano Letters, vol. 17, no. 9, Sept. 2017, pp. 5452–57. EBSCOhost, https://doi.org/10.1021/acs.nanolett.7b02099.
APA
Hsieh, K., Kochat, V., Xiang Zhang, Yongji Gong, Tiwary, C. S., Ajayan, P. M., & Ghosh, A. (2017). Effect of Carrier Localization on Electrical Transport and Noise at Individual Grain Boundaries in Monolayer MoS2. Nano Letters, 17(9), 5452–5457. https://doi.org/10.1021/acs.nanolett.7b02099
Chicago
Hsieh, Kimberly, Vidya Kochat, Xiang Zhang, Yongji Gong, Chandra Sekhar Tiwary, Pulickel M. Ajayan, and Arindam Ghosh. 2017. “Effect of Carrier Localization on Electrical Transport and Noise at Individual Grain Boundaries in Monolayer MoS2.” Nano Letters 17 (9): 5452–57. doi:10.1021/acs.nanolett.7b02099.