Back to Search
Start Over
Time-of-flight secondary ion mass spectrometry of wet and dry chemically treated display glass surfaces.
- Source :
-
Journal of the American Ceramic Society . Oct2017, Vol. 100 Issue 10, p4770-4784. 15p. 2 Illustrations. - Publication Year :
- 2017
-
Abstract
- Display glasses meet the demands of the flat panel display industry vis-à-vis their composition, flatness, and forming processes. Here, we report the high-resolution time-of-flight secondary ion mass spectrometry (ToF-SIMS) characterization of Corning® EAGLE XG®, a widely used display glass, and subsequent chemometric analyses of these data. Samples analyzed included the as-formed glass, fracture surfaces from remelt bars, and as-formed surfaces subsequently exposed to process-relevant treatments, including strong acids and bases, two industrial detergents, and an atmospheric-pressure plasma treatment. Elemental signals in the positive ion ToF-SIMS spectra respond to surface treatments. Acidic conditions leach non-silica components from the surfaces, while basic treatments extract these species less efficiently. The detergents leave residues of Na+ and K+. The atmospheric pressure (AP) plasma treatment had little effect on the surface composition, while the melt surface differs significantly from the bulk fracture surface. Above ca. 75 m/z, the negative ion spectra are dominated by two series of homologous cluster ions with compositions of Si nO2 n+2Al− and Si mHO2 m+1H−. The presence of these clusters suggests that analogous structures exist at the near surface regions of the samples. In a series of multivariate curve resolution (MCR) analyses, two or three MCR components captured >95% of the variance in the data for these samples. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00027820
- Volume :
- 100
- Issue :
- 10
- Database :
- Academic Search Index
- Journal :
- Journal of the American Ceramic Society
- Publication Type :
- Academic Journal
- Accession number :
- 125257551
- Full Text :
- https://doi.org/10.1111/jace.14967