Cite
Performance and Reliability Codesign for Superjunction Drain Extended MOS Devices.
MLA
Somayaji, Jhnanesh, et al. “Performance and Reliability Codesign for Superjunction Drain Extended MOS Devices.” IEEE Transactions on Electron Devices, vol. 64, no. 10, Oct. 2017, pp. 4175–83. EBSCOhost, https://doi.org/10.1109/TED.2017.2733043.
APA
Somayaji, J., Bhat, M. S., Kumar, B. S., & Shrivastava, M. (2017). Performance and Reliability Codesign for Superjunction Drain Extended MOS Devices. IEEE Transactions on Electron Devices, 64(10), 4175–4183. https://doi.org/10.1109/TED.2017.2733043
Chicago
Somayaji, Jhnanesh, M. S. Bhat, B. Sampath Kumar, and Mayank Shrivastava. 2017. “Performance and Reliability Codesign for Superjunction Drain Extended MOS Devices.” IEEE Transactions on Electron Devices 64 (10): 4175–83. doi:10.1109/TED.2017.2733043.