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Retraction notice to "Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique" [Appl. Surf. Sci. 253 (December (4)) (2006) 1787–1795].

Authors :
Sahoo, N.K.
Thakur, S.
Tokas, R.B.
Source :
Applied Surface Science. Jan2018 Part A, Vol. 427, p1280-1280. 1p.
Publication Year :
2018

Subjects

Subjects :
*SILICON oxide films
*GADOLINIUM

Details

Language :
English
ISSN :
01694332
Volume :
427
Database :
Academic Search Index
Journal :
Applied Surface Science
Publication Type :
Academic Journal
Accession number :
125805640
Full Text :
https://doi.org/10.1016/j.apsusc.2017.10.062