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Thermal stability and high-temperature shape memory effect of Ni55.2Mn24.7Ga19.9Gd0.2 thin film.
- Source :
-
Vacuum . Jan2018, Vol. 147, p78-81. 4p. - Publication Year :
- 2018
-
Abstract
- Thermal stability and shape memory effect (SME) of Ni-Mn-Ga-based thin film were firstly investigated. The fluctuation scope of phase transformation temperatures did not exceed 2 °C during 100 thermal cycles. The maximum SME of 0.64% was quantitatively measured under 600 MPa applied stress. SME almost kept constant after 20 times thermal cycling deformation under 300 MPa applied stress. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 0042207X
- Volume :
- 147
- Database :
- Academic Search Index
- Journal :
- Vacuum
- Publication Type :
- Academic Journal
- Accession number :
- 126363656
- Full Text :
- https://doi.org/10.1016/j.vacuum.2017.10.022