Cite
Pixel-based absolute surface metrology by three flat test with shifted and rotated maps.
MLA
Zhai, Dede, et al. “Pixel-Based Absolute Surface Metrology by Three Flat Test with Shifted and Rotated Maps.” Optics & Lasers in Engineering, vol. 102, Mar. 2018, pp. 92–99. EBSCOhost, https://doi.org/10.1016/j.optlaseng.2017.10.021.
APA
Zhai, D., Chen, S., Xue, S., & Yin, Z. (2018). Pixel-based absolute surface metrology by three flat test with shifted and rotated maps. Optics & Lasers in Engineering, 102, 92–99. https://doi.org/10.1016/j.optlaseng.2017.10.021
Chicago
Zhai, Dede, Shanyong Chen, Shuai Xue, and Ziqiang Yin. 2018. “Pixel-Based Absolute Surface Metrology by Three Flat Test with Shifted and Rotated Maps.” Optics & Lasers in Engineering 102 (March): 92–99. doi:10.1016/j.optlaseng.2017.10.021.