Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray diffraction: Application to chromia-forming metallic alloys.

MLA

Guerain, Mathieu, et al. “Residual Stress Determination in Oxide Layers at Different Length Scales Combining Raman Spectroscopy and X-Ray Diffraction: Application to Chromia-Forming Metallic Alloys.” Journal of Applied Physics, vol. 122, no. 19, Nov. 2017, pp. 1–9. EBSCOhost, https://doi.org/10.1063/1.4990146.

APA

Guerain, M., Grosseau-Poussard, J.-L., Geandier, G., Panicaud, B., Tamura, N., Kunz, M., Dejoie, C., Micha, J.-S., Thiaudière, D., & Goudeau, P. (2017). Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray diffraction: Application to chromia-forming metallic alloys. Journal of Applied Physics, 122(19), 1–9. https://doi.org/10.1063/1.4990146

Chicago

Guerain, Mathieu, Jean-Luc Grosseau-Poussard, Guillaume Geandier, Benoit Panicaud, Nobumichi Tamura, Martin Kunz, Catherine Dejoie, Jean-Sebastien Micha, Dominique Thiaudière, and Philippe Goudeau. 2017. “Residual Stress Determination in Oxide Layers at Different Length Scales Combining Raman Spectroscopy and X-Ray Diffraction: Application to Chromia-Forming Metallic Alloys.” Journal of Applied Physics 122 (19): 1–9. doi:10.1063/1.4990146.