Study of Electron Traps Associated With Oxygen Superlattices in n-Type Silicon.

MLA

Simoen, Eddy, et al. “Study of Electron Traps Associated With Oxygen Superlattices in N-Type Silicon.” Physica Status Solidi (C), vol. 14, no. 12, Dec. 2017, p. n/a-N.PAG. EBSCOhost, https://doi.org/10.1002/pssc.201700136.

APA

Simoen, E., Jayachandran, S., Delabie, A., Caymax, M., & Heyns, M. (2017). Study of Electron Traps Associated With Oxygen Superlattices in n-Type Silicon. Physica Status Solidi (C), 14(12), n/a-N.PAG. https://doi.org/10.1002/pssc.201700136

Chicago

Simoen, Eddy, Suseendran Jayachandran, Annelies Delabie, Matty Caymax, and Marc Heyns. 2017. “Study of Electron Traps Associated With Oxygen Superlattices in N-Type Silicon.” Physica Status Solidi (C) 14 (12): n/a-N.PAG. doi:10.1002/pssc.201700136.