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Robust and Cascadable Nonvolatile Magnetoelectric Majority Logic.

Authors :
Jaiswal, Akhilesh
Agrawal, Amogh
Roy, Kaushik
Source :
IEEE Transactions on Electron Devices. Dec2017, Vol. 64 Issue 12, p5209-5216. 8p.
Publication Year :
2017

Abstract

Nonvolatile logic computations are of particular interest due to their zero standby leakage power consumption. In this paper, we explore a nonvolatile majority logic using voltage-driven magnetoelectric (ME) switching of ferromagnets. Specifically, we employ ME magnetic tunnel junctions (ME-MTJs) connected in parallel to construct a majority gate. We also present the cascadability of the proposed majority gate using CMOS inverters. Furthermore, through a mixed-mode simulation framework consisting of magnetization dynamics and electron transport model, we analyze the robustness of the proposed majority gate under process variations. Our analysis shows that due to parallel connection of the ME-MTJs, high tunnel magnetoresistance (TMR) ratios are required for proper functioning of the proposed majority gate, in presence of variations. In order to relax the constraints on the TMR requirements, we present an alternate implementation of the majority logic that does not require a parallel connection of ME-MTJs, thereby increasing the robustness against process variations. Energy and delay metrics are presented for a full adder implementation using the proposed majority gates. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
64
Issue :
12
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
127950441
Full Text :
https://doi.org/10.1109/TED.2017.2766570