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Optical study of Tm-doped solid solution (Sc0.5Y0.5)2SiO5 crystal.

Authors :
Shi, Jiaojiao
Liu, Bin
Zheng, Lihe
Wang, Qingguo
Tang, Huili
Liu, Junfang
Su, Liangbi
Wu, Feng
Zhao, Hengyu
He, Nuotian
Li, Na
Li, Qiu
Guo, Chao
Xu, Jun
Yang, Kejian
Xu, Xiaodong
Ryba-Romanowski, Witold
Lisiecki, Radosław
Solarz, Piotr
Source :
Journal of Crystal Growth. Apr2018, Vol. 487, p83-86. 4p.
Publication Year :
2018

Abstract

Tm-doped (Sc 0.5 Y 0.5 ) 2 SiO 5 (SYSO) crystals were grown by Czochralski method. The UV-VIR-NIR absorption spectra and the near-infrared emission spectra were measured and analysed by the Judd-Ofelt approach. Temperature influence on both absorption and emission spectra has been determined from the data recorded at room temperature and 10 K. It has been found that the structural disorder resulting from dissimilar ionic radii of Sc 3+ and Y 3+ in the solid solution (Sc 0.5 Y 0.5 ) 2 SiO 5 crystal brings about a strong inhomogeneous broadening of Tm 3+ ions spectra. However, it affects the excited state relaxation dynamics inherent to thulium-doped Y 2 SiO 5 and Sc 2 SiO 5 hosts weakly. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00220248
Volume :
487
Database :
Academic Search Index
Journal :
Journal of Crystal Growth
Publication Type :
Academic Journal
Accession number :
128390858
Full Text :
https://doi.org/10.1016/j.jcrysgro.2018.02.006