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Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs.
- Source :
-
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems . Apr2018, Vol. 37 Issue 4, p883-895. 13p. - Publication Year :
- 2018
-
Abstract
- Manufacturing defects that do not affect the functional operation of low power integrated circuits (ICs) can nevertheless impact their power saving capability. We show that stuck-ON faults on the power switches and resistive bridges between the power networks can impair the power saving capability of power-gating designs. For quantifying the impact of such faults on the power savings of power-gating designs, we propose a diagnosis technique that targets bridges between the power networks. The proposed technique is based on the static power analysis of a power-gating design in stand-by mode and it utilizes a novel on-chip signature generation unit, which is sensitive to the voltage level between power rails, the measurements of which are processed off-line for the diagnosis of bridges that can adversely affect power savings. We explore, through SPICE simulation of the largest IWLS’05 benchmarks synthesized using a 32 nm CMOS technology, the tradeoffs achieved by the proposed technique between diagnosis accuracy and area cost and we evaluate its robustness against process variation. The proposed technique achieves a diagnosis resolution that is higher than 98.6% and 97.9% for bridges of R~\gtrsim ~10~ M\Omega (weak bridges) and bridges of R~\lesssim~10~ M\Omega (strong bridges), respectively, and a diagnosis accuracy higher than 94.5% for all the examined defects. The area overhead is small and scalable: it is found to be 1.8% and 0.3% for designs with 27 K and 157 K gate equivalents, respectively. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 02780070
- Volume :
- 37
- Issue :
- 4
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems
- Publication Type :
- Academic Journal
- Accession number :
- 128555067
- Full Text :
- https://doi.org/10.1109/TCAD.2017.2729462