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Double negatively charged carbon vacancy at the h- and k-sites in 4H-SiC: Combined Laplace-DLTS and DFT study.

Authors :
Capan, Ivana
Brodar, Tomislav
Pastuović, Željko
Siegele, Rainer
Ohshima, Takeshi
Sato, Shin-ichiro
Makino, Takahiro
Snoj, Luka
Radulović, Vladimir
Coutinho, José
Torres, Vitor J. B.
Demmouche, Kamel
Source :
Journal of Applied Physics. 2018, Vol. 123 Issue 16, pN.PAG-N.PAG. 6p. 1 Diagram, 2 Charts, 3 Graphs.
Publication Year :
2018

Abstract

We present results from combined Laplace-Deep Level Transient Spectroscopy (Laplace-DLTS) and density functional theory studies of the carbon vacancy (VC) in n-type 4<italic>H</italic>-SiC. Using Laplace-DLTS, we were able to distinguish two previously unresolved sub-lattice-inequivalent emissions, causing the broad Z1/2 peak at 290 K that is commonly observed by conventional DLTS in n-type 4<italic>H</italic>-SiC. This peak has two components with activation energies for electron emission of 0.58 eV and 0.65 eV. We compared these results with the acceptor levels of VC obtained by means of hybrid density functional supercell calculations. The calculations support the assignment of the Z1/2 signal to a superposition of emission peaks from double negatively charged VC defects. Taking into account the measured and calculated energy levels, the calculated relative stability of VC in hexagonal (<italic>h</italic>) and cubic (<italic>k</italic>) lattice sites, as well as the observed relative amplitude of the Laplace-DLTS peaks, we assign Z1 and Z2 to VC(<italic>h</italic>) and VC(<italic>k</italic>), respectively. We also present the preliminary results of DLTS and Laplace-DLTS measurements on deep level defects (ET1 and ET2) introduced by fast neutron irradiation and He ion implantation in 4<italic>H</italic>-SiC. The origin of ET1 and ET2 is still unclear. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
123
Issue :
16
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
129382433
Full Text :
https://doi.org/10.1063/1.5011124