Microwave Characterization of Ba-Substituted PZT and ZnO Thin Films.

MLA

Tierno, Davide, et al. “Microwave Characterization of Ba-Substituted PZT and ZnO Thin Films.” IEEE Transactions on Ultrasonics Ferroelectrics & Frequency Control, vol. 65, no. 5, May 2018, pp. 881–88. EBSCOhost, https://doi.org/10.1109/TUFFC.2018.2812424.

APA

Tierno, D., Dekkers, M., Wittendorp, P., Sun, X., Bayer, S. C., King, S. T., Van Elshocht, S., Heyns, M., Radu, I. P., & Adelmann, C. (2018). Microwave Characterization of Ba-Substituted PZT and ZnO Thin Films. IEEE Transactions on Ultrasonics Ferroelectrics & Frequency Control, 65(5), 881–888. https://doi.org/10.1109/TUFFC.2018.2812424

Chicago

Tierno, Davide, Matthijn Dekkers, Paul Wittendorp, Xiao Sun, Samuel C. Bayer, Seth T. King, Sven Van Elshocht, Marc Heyns, Iuliana P. Radu, and Christoph Adelmann. 2018. “Microwave Characterization of Ba-Substituted PZT and ZnO Thin Films.” IEEE Transactions on Ultrasonics Ferroelectrics & Frequency Control 65 (5): 881–88. doi:10.1109/TUFFC.2018.2812424.