Dissociation of dicyclohexyl phthalate molecule induced by low-energy electron impact.

Experimental investigation of electron ionization (EI) of and electron attachment (EA) onto dicyclohexyl phthalate (DCHP) was carried out using a crossed electron and molecular beam technique. Formation of positive and negative ions by EI and EA with the corresponding dissociation processes was studied and discussed. Due to a low ion yield of the parent positive ion, we were not able to estimate the ionization energy of DCHP. However, we estimated the appearance energies for the protonated phthalate anhydride (<italic>m/z</italic> 149) to be 10.5 eV and other significant ionic fragments of <italic>m/z</italic> 249 [DCHP—(R—2H)]+, <italic>m/z</italic> 167 [DCHP—(2R—3H)]+, and <italic>m/z</italic> 83 [C6H11]+. The reaction mechanisms of the dissociative ionization process were discussed. In the case of negative ions, we estimated the relative cross sections for a transient negative ion (TNI) and for several detected ions. At low electron energies (close to 0 eV), the TNI of DCHP molecules was the dominant ion, with products of dissociative EA dominating in broad resonances at 7.5 and 8.5 eV. [ABSTRACT FROM AUTHOR]