Investigation of the retention performance of an ultra-thin HfO2 resistance switching layer in an integrated memory device.

The retention behavior of a HfO2 resistive switching memory device with a diameter of 28 nm and an ultra-thin (1 nm) HfO2 layer as the switching layer was examined. Ta and TiN served as the oxygen vacancy (VO) supplying the top and inert bottom electrodes, respectively. Unlike the retention failure phenomenon reported in other thicker oxide-based resistance switching memory devices, the current of both the low and high resistance states suddenly increased at a certain time, causing retention failure. Through the retention tests of the devices in different resistance states, it was concluded that the involvement of the reset step induced the retention failure. The pristine device contained a high portion of VO-rich region and the location of the border between the VO-rich and VO-free regions played the critical role in governing the retention performance. During the reset step, this borderline moves towards the Ta electrode, but moves back to the original location during the retention period, which eventually induces the reconnection of the disconnected conducting filament (in a high resistance state) or strengthens the connected weak portion (low resistance state). The activation energy for the retention failure mechanism was 0.15 eV, which is related to the ionization of neutral VO to ionized VO. [ABSTRACT FROM AUTHOR]