Cite
Interface electronic property of organic/organic heterostructure visualized via kelvin probe force microscopy.
MLA
Niu, Xiaona, et al. “Interface Electronic Property of Organic/Organic Heterostructure Visualized via Kelvin Probe Force Microscopy.” Organic Electronics, vol. 61, Oct. 2018, pp. 383–88. EBSCOhost, https://doi.org/10.1016/j.orgel.2018.06.018.
APA
Niu, X., Chen, J., Wang, Z., Zhou, X., Wang, Z., Huang, L., & Chi, L. (2018). Interface electronic property of organic/organic heterostructure visualized via kelvin probe force microscopy. Organic Electronics, 61, 383–388. https://doi.org/10.1016/j.orgel.2018.06.018
Chicago
Niu, Xiaona, Jianmei Chen, Zhifang Wang, Xu Zhou, Zi Wang, Lizhen Huang, and Lifeng Chi. 2018. “Interface Electronic Property of Organic/Organic Heterostructure Visualized via Kelvin Probe Force Microscopy.” Organic Electronics 61 (October): 383–88. doi:10.1016/j.orgel.2018.06.018.