Analytical and Experimental Validation of Robustness of the Current Mirrors to EMI.

This paper presents two electromagnetic interference (EMI) resisting current mirror topologies that use a linearization technique to filter out the EMI without producing any offset at the output. A proposed current mirror illustrating the linearization concept is implemented in standard $\text{0.18}\;\mu \text{m}$ mixed-mode CMOS technology. Measurement results show that for a frequency range of 10 kHz–10 MHz, the EMI-induced offset current produced by the proposed current mirror is negligible as compared to the traditional current mirror. [ABSTRACT FROM AUTHOR]