Effect of substrate temperature on structural and magnetic properties of c-axis oriented spinel ferrite Ni0.65Zn0.35Fe2O4 (NZFO) thin films.

Abstract Varying the substrate temperature changes structural and magnetic properties of spinel ferrite Ni 0.65 Zn 0.35 Fe 2 O 4 (NZFO) thin films. X-ray diffraction of films grown at different temperature display only (004) reflections, without any secondary peaks, showing growth orientation along the c-axis. We find an increase in crystalline quality of these thin films with the rise of substrate temperature. The surface topography of thin films grown at different growth temperatures reveal that these films are smooth with low roughness; however, the thin films grown at 800 °C exhibit lowest average and root mean square (rms) roughness among all thin films. We find iron and nickel to be more oxidized (greater Fe3+ and Ni3+ content) in films grown and annealed at 700 °C and 800 °C, compared to those films grown at lower temperatures. The magnetic moment is observed to increase with an increase of substrate temperature and all thin films possess high saturation magnetization and low coercive field at room temperature. Films grown at 800 °C exhibit a ferrimagnetic–paramagnetic phase transition well above room temperature. The observed large magnetizations with soft magnetic behavior in NZFO thin films above room temperature suggest potential applications in memory, spintronics, and multifunctional devices. Highlights • Highly c-axis oriented NZFO thin films were grown by PLD technique. • Varying the substrate temperature changes structural and magnetic properties. • All thin films exhibit high Ms, low Mr and low Hc at room temperature. • The M s is found to be increased with increase of substrate temperature. • Thin films grown at 800 °C exhibit a ferrimagnetic Tc ∼716 (±10) K. [ABSTRACT FROM AUTHOR]