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On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits.
- Source :
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IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems . Oct2018, Vol. 37 Issue 10, p2152-2165. 14p. - Publication Year :
- 2018
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Abstract
- Opens are known to be one of the predominant defects in nanoscale technologies. With an increasing number of complex cells in today’s very large-scale integration designs intracell opens are becoming a larger and larger problem. Typically, these defects are modeled by transistor stuck-off faults (TSOFs) and assumed to be detected by transition delay fault (TDF) timing tests. However, tests for TDF fail to detect a high percentage of TSOFs and even tools that target them directly are not sufficient to screen all open defects. Furthermore, generated tests might be invalidated in case hazards and charge-sharing are not properly considered. In this paper, we present a waveform-accurate SAT-based automatic test pattern generation (ATPG) framework to tackle these problems. The proposed method not only allows for the generation of tests that are robust against hazards and charge-sharing, it can also be used to generate tests for faults only detectable by hazard-based activation—and hence even increase the fault coverage beyond state-of-the-art cell-aware tests. Our experimental results for the largest ITC’99, IWLS 2005 as well as larger industrial circuits mapped to the state-of-the-art NanGate 45-nm as well as NanGate 15-nm cell library using complex cells show the high efficiency and scalability of the proposed method. For example, the results show that without properly considering hazards and charge-sharing up to 17.9% of the generated tests could be invalidated. In addition, hazard-activated ATPG allows to detect an additional 10.1% of conventionally undetectable faults that could result in a very significant defective parts per million improvement. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 02780070
- Volume :
- 37
- Issue :
- 10
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems
- Publication Type :
- Academic Journal
- Accession number :
- 131880704
- Full Text :
- https://doi.org/10.1109/TCAD.2017.2772825