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A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors.
- Source :
-
IEEE Transactions on Instrumentation & Measurement . Oct2018, Vol. 67 Issue 10, p2363-2372. 10p. - Publication Year :
- 2018
-
Abstract
- In this paper, a gray-scale CMOS image sensor (CIS) characterization system with an optimization feature has been proposed. By using a very fast and precise control of light intensity, based on the pulsewidth-modulation method, it is avoided to measure the illuminance every time. These features accelerate the multicriteria CIS optimization requiring many thousands of measurements. The system throughput is 2.5 Gb/s, which allows for capturing images from large arrays of the size $3000 \times 3000$ pixels at the rate of 25 frames/s, or small arrays ($128 \times 128$) at the rate of 15 000 frames/s. The efficient transfer of measurement data to the external software allows immediate presentation of optimization results in 3-D plots. The system automatically measures nonuniformity, spatial noise, temporal noise, signal-to-noise ratio, dynamic range, nonlinearity and image lag. A flat diffuser has been proposed as a cheaper alternative to an integrating sphere. This optical front-end is particularly useful for testing prototype CISs and vision-chips implemented in standard CMOS technologies as low- or medium-dynamic-range imagers. [ABSTRACT FROM AUTHOR]
- Subjects :
- *CMOS image sensors
*LUMINOUS flux
*SIGNAL-to-noise ratio
*IMAGE sensors
Subjects
Details
- Language :
- English
- ISSN :
- 00189456
- Volume :
- 67
- Issue :
- 10
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Instrumentation & Measurement
- Publication Type :
- Academic Journal
- Accession number :
- 131880980
- Full Text :
- https://doi.org/10.1109/TIM.2018.2814118