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TEL Logic Style as a Countermeasure Against Side-Channel Attacks: Secure Cells Library in 65nm CMOS and Experimental Results.
- Source :
-
IEEE Transactions on Circuits & Systems. Part I: Regular Papers . Nov2018, Vol. 65 Issue 11, p3874-3884. 11p. - Publication Year :
- 2018
-
Abstract
- This paper presents experimental results on a dual-rail pre-charge logic family whose power consumption is insensitive to unbalanced load conditions. The proposed logic family is based on the time enclosed logic (TEL) encoding and can be viewed as an improvement of the delay based dual rail pre-charge logic (DDPL) logic style. The DDPL logic gates have been redesigned to avoid the early evaluation effect and to reduce area and power consumption. A library of TEL secure gates and flip-flops has been implemented in a 65 nm CMOS process. The developed library allows adopting a semi-custom design flow (automatic place and route) without any constraint on the routing of the complementary wires. A four bit lightweight crypto core has been implemented on a 65 nm CMOS testchip by using the developed TEL library and compared against a SABL implementation of the same crypto core on the same chip. Comparisons have been carried out by means of extensive transistor level simulations and measurements on the 65 nm testchip which allowed to evaluate a wide set of security metrics. Experimental results have shown a strong reduction of the information leakage with respect to the sense amplifier based logic logic style under mismatched load conditions with an improvement in the measurements to disclosure of more than three orders of magnitude. [ABSTRACT FROM AUTHOR]
- Subjects :
- *COMPLEMENTARY metal oxide semiconductors
*ELECTRONIC countermeasures
*TRANSISTORS
Subjects
Details
- Language :
- English
- ISSN :
- 15498328
- Volume :
- 65
- Issue :
- 11
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Circuits & Systems. Part I: Regular Papers
- Publication Type :
- Periodical
- Accession number :
- 132209256
- Full Text :
- https://doi.org/10.1109/TCSI.2018.2861738