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Characterization and Modification of Adhesion in Dry and Wet Environments in Thin-Film Parylene Systems.

Authors :
Ortigoza-Diaz, Jessica
Scholten, Kee
Meng, Ellis
Source :
Journal of Microelectromechanical Systems. Oct2018, Vol. 27 Issue 5, p874-885. 12p.
Publication Year :
2018

Abstract

Parylene C is a thin-film polymer used as a biocompatible barrier layer in biomedical implants and implantable MEMS; free-film Parylene C may serve as both the substrate and insulation in polymer-based microdevices, a growing branch of biomedical technology. The adhesion of vapor deposited Parylene C, particularly when exposed to wet, in vivo environments, is a critical determinant of device lifetime for such polymer-based implants. This paper explores several novel strategies for improving the adhesion of multi-layer Parylene structures, including thermal annealing and the use of several chemical interposer layers. Interfacial adhesion of Parylene-Parylene and Parylene-platinum-Parylene films was examined using a standard T-peel test to quantify adhesion and measure film integrity under chronic exposure to saline up to two years. Improved adhesion and barrier properties in Parylene-Parylene films resulted from the inclusion of diamond-like carbon and ethylene glycol diacrylate layers. Thermal annealing improved Parylene film integrity in wet environments but was insufficient for improving the integrity of Parylene-platinum interfaces. A 100-fold increase in adhesive strength at such interfaces was achieved using a commercially available adhesion promoter, and the corresponding improvements in resistance to moisture driven delamination were observed. X-ray diffraction and X-ray photoelectron spectroscopy results are provided to highlight the role of film morphology and surface composition in adhesion integrity. [2018-0076] [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10577157
Volume :
27
Issue :
5
Database :
Academic Search Index
Journal :
Journal of Microelectromechanical Systems
Publication Type :
Academic Journal
Accession number :
132209646
Full Text :
https://doi.org/10.1109/JMEMS.2018.2854636