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Electrical properties and structural transition of Ge2Sb2Te5 adjusted by rare-earth element Gd for nonvolatile phase-change memory.

Authors :
Chen, Yongjin
Chen, Nianke
Chen, Bin
Zhang, Qing
Li, Xianbin
Deng, Qingsong
Zhang, Bin
Zhang, Shengbai
Zhang, Ze
Han, Xiaodong
Source :
Journal of Applied Physics. 2018, Vol. 124 Issue 14, pN.PAG-N.PAG. 7p. 1 Diagram, 1 Chart, 6 Graphs.
Publication Year :
2018

Abstract

Phase change memory has been considered as the next generation in non-volatile electronic data storage. The property modulation of such materials by the doping of rare-earth elements has drawn a lot of attention, which motivates us to search for the optimal dopants and reveal the underlying mechanisms. Here, we investigate the role of Gd as a dopant in Ge2Sb2Te5, which exhibits higher crystalline resistance and better thermal stability and antioxidant capacity than the undoped counterpart. Moreover, Gd dopants suppress both the processes of phase transition and grain growth. The crystalline structure remains unchanged with Gd dopants and vacancies are randomly distributed. Furthermore, the bonding mechanism was theoretically investigated. In the amorphous state, Gd atoms modify the local structures around Ge, Sb, and Te atoms. The large coordination number of Gd and the "Gd–Te distorted pentagonal bipyramidal-like" structure can be attributed to the good thermal stability. These microscopic findings figure out some of the key issues about the bonding mechanism, electrical properties, and crystallization behaviors of Gd doped phase change memory materials, which could be useful for storage devices. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
124
Issue :
14
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
132368225
Full Text :
https://doi.org/10.1063/1.5040988