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Gradient Descent Using Stochastic Circuits for Efficient Training of Learning Machines.

Authors :
Liu, Siting
Jiang, Honglan
Liu, Leibo
Han, Jie
Source :
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Nov2018, Vol. 37 Issue 11, p2530-2541. 12p.
Publication Year :
2018

Abstract

Gradient descent (GD) is a widely used optimization algorithm in machine learning. In this paper, a novel stochastic computing GD circuit (SC-GDC) is proposed by encoding the gradient information in stochastic sequences. Inspired by the structure of a neuron, a stochastic integrator is used to optimize the weights in a learning machine by its “inhibitory” and “excitatory” inputs. Specifically, two AND (or XNOR) gates for the unipolar representation (or the bipolar representation) and one stochastic integrator are, respectively, used to implement the multiplications and accumulations in a GD algorithm. Thus, the SC-GDC is very area- and power-efficient. As per the formulation of the proposed SC-GDC, it provides unbiased estimate of the optimized weights in a learning algorithm. The proposed SC-GDC is then used to implement a least-mean-square algorithm and a softmax regression. With a similar accuracy, the proposed design achieves more than $30 \times $ improvement in throughput per area (TPA) and consumes less than 13% of the energy per training sample, compared with a fixed-point implementation. Moreover, a signed SC-GDC is proposed for training complex neural networks (NNs). It is shown that for a 784-128-128-10 fully connected NN, the signed SC-GDC produces a similar training result with its fixed-point counterpart, while achieving more than 90% energy saving and 82% reduction in training time with more than $50 \times $ improvement in TPA. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
02780070
Volume :
37
Issue :
11
Database :
Academic Search Index
Journal :
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems
Publication Type :
Academic Journal
Accession number :
132478560
Full Text :
https://doi.org/10.1109/TCAD.2018.2858363