Cite
Variability Study of MWCNT Local Interconnects Considering Defects and Contact Resistances—Part I: Pristine MWCNT.
MLA
Chen, Rongmei, et al. “Variability Study of MWCNT Local Interconnects Considering Defects and Contact Resistances—Part I: Pristine MWCNT.” IEEE Transactions on Electron Devices, vol. 65, no. 11, Nov. 2018, pp. 4955–62. EBSCOhost, https://doi.org/10.1109/TED.2018.2868421.
APA
Chen, R., Liang, J., Lee, J., Georgiev, V. P., Ramos, R., Okuno, H., Kalita, D., Cheng, Y., Zhang, L., Pandey, R. R., Amoroso, S., Millar, C., Asenov, A., Dijon, J., & Todri-Sanial, A. (2018). Variability Study of MWCNT Local Interconnects Considering Defects and Contact Resistances—Part I: Pristine MWCNT. IEEE Transactions on Electron Devices, 65(11), 4955–4962. https://doi.org/10.1109/TED.2018.2868421
Chicago
Chen, Rongmei, Jie Liang, Jaehyun Lee, Vihar P. Georgiev, Raphael Ramos, Hanako Okuno, Dipankar Kalita, et al. 2018. “Variability Study of MWCNT Local Interconnects Considering Defects and Contact Resistances—Part I: Pristine MWCNT.” IEEE Transactions on Electron Devices 65 (11): 4955–62. doi:10.1109/TED.2018.2868421.