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Transient Performance Analysis and Optimization of Crossbar Memory Arrays Using NbO2-Based Threshold Switching Selectors.

Authors :
Pan, Chenyun
Naeemi, Azad
Source :
IEEE Transactions on Electron Devices. Aug2018, Vol. 65 Issue 8, p3214-3220. 7p.
Publication Year :
2018

Abstract

Performance of the crossbar memory array highly depends on the selector characteristics. In this paper, rigorous transient analyses are performed for a large-size crossbar memory array using novel NbO2-based selectors with a threshold switching behavior. To enable accurate and efficient array-level simulation, an electrostatic discharge-based compact model is employed to effectively describe the ${I}$ – ${V}$ characteristics of the selector. Multiple key design parameters of the selector are investigated, such as the threshold voltage, leakage current, and intrinsic switching speed. A sensitivity analysis is performed to evaluate the impact of hypothetical improvements in various selector parameters. In addition, the impacts of resistances of interconnect and memory element on the array-level access delay and energy dissipation are quantified. The results show that reducing the threshold voltage of selectors provides the most significant performance improvement, where up to 80% of the energy-delay product saving is observed if the threshold voltage is reduced by 50%. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
65
Issue :
8
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
132684403
Full Text :
https://doi.org/10.1109/TED.2018.2848844