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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices.
- Source :
-
IEEE Transactions on Electron Devices . Aug2018, Vol. 65 Issue 8, p3582-3582. 1p. - Publication Year :
- 2018
-
Abstract
- Describes the above-named upcoming special issue or section. May include topics to be covered or calls for papers. [ABSTRACT FROM AUTHOR]
- Subjects :
- *IEEE 802 standard
*COMPLEMENTARY metal oxide semiconductors
*ENERGY consumption
Subjects
Details
- Language :
- English
- ISSN :
- 00189383
- Volume :
- 65
- Issue :
- 8
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Electron Devices
- Publication Type :
- Academic Journal
- Accession number :
- 132684424
- Full Text :
- https://doi.org/10.1109/TED.2018.2856678