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Switching Voltage Analysis of Nanoelectromechanical Memory Switches for Monolithic 3-D CMOS-NEM Hybrid Reconfigurable Logic Circuits.

Authors :
Lee, Ho Moon
Jo, Hyun Chan
Kwon, Hyug Su
Choi, Woo Young
Source :
IEEE Transactions on Electron Devices. Sep2018, Vol. 65 Issue 9, p3780-3785. 6p.
Publication Year :
2018

Abstract

The accurate calculation of switching voltage (${V}_{s}$) is necessary for the reliable and low-power operation of monolithic 3-D (M3D) CMOS-nanoelectromechanical (NEM) hybrid reconfigurable logic circuits because ${V}_{s}$ corresponds to the operating voltage (${V}_{\text {dd}}$) of NEM memory switches. In this paper, based on the Euler–Bernoulli equation, the physics-based analytical model is proposed to determine ${V}_{s}$. The accuracy of the proposed model is verified by both the finite-element analysis and experimental results. Our proposed model shows >3% error compared with experimental data. Also, the design guidelines of NEM memory switches are presented in terms of minimum ${V}_{s}$ (${V}_{s\_{}{m}}$) and device dimensions. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
65
Issue :
9
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
132684456
Full Text :
https://doi.org/10.1109/TED.2018.2858775