Cite
As-grown-Generation Model for Positive Bias Temperature Instability.
MLA
Gao, Rui, et al. “As-Grown-Generation Model for Positive Bias Temperature Instability.” IEEE Transactions on Electron Devices, vol. 65, no. 9, Sept. 2018, pp. 3662–68. EBSCOhost, https://doi.org/10.1109/TED.2018.2857000.
APA
Gao, R., Ji, Z., Zhang, J. F., Marsland, J., & Zhang, W. D. (2018). As-grown-Generation Model for Positive Bias Temperature Instability. IEEE Transactions on Electron Devices, 65(9), 3662–3668. https://doi.org/10.1109/TED.2018.2857000
Chicago
Gao, Rui, Zhigang Ji, Jian Fu Zhang, John Marsland, and Wei Dong Zhang. 2018. “As-Grown-Generation Model for Positive Bias Temperature Instability.” IEEE Transactions on Electron Devices 65 (9): 3662–68. doi:10.1109/TED.2018.2857000.