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Ab Initio Simulation of Band-to-Band Tunneling FETs With Single- and Few-Layer 2-D Materials as Channels.

Authors :
Szabo, Aron
Klinkert, Cedric
Campi, Davide
Stieger, Christian
Marzari, Nicola
Luisier, Mathieu
Source :
IEEE Transactions on Electron Devices. Oct2018, Vol. 65 Issue 10, p4180-4187. 8p.
Publication Year :
2018

Abstract

Full-band atomistic quantum transport simulations based on first principles are employed to assess the potential of band-to-band tunneling FETs (TFETs) with a 2-D channel material as future electronic circuit components. We demonstrate that single-layer (SL) transition metal dichalcogenides are not well suited for TFET applications. There might, however, exist a great variety of 2-D semiconductors that have not even been exfoliated yet; this paper pinpoints some of the most promising candidates among them to realize highly efficient TFETs. SL SnTe, As, TiNBr, and Bi are all found to ideally deliver ON-currents larger than 100 $\mu \text{A}/\mu \text{m}$ at 0.5-V supply voltage and 0.1 nA/ $\mu \text{m}$ OFF-current value. We show that going from single to multiple layers can boost the TFET performance as long as the gain from a narrowing bandgap exceeds the loss from the deteriorating gate control. Finally, a 2-D van der Waals heterojunction TFET is revealed to perform almost as well as the best SL homojunction, paving the way for research in optimal 2-D material combinations. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
65
Issue :
10
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
132684500
Full Text :
https://doi.org/10.1109/TED.2018.2840436