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Yielding optimized dependability assurance through bit inversion.

Authors :
Zhang, Jiangwei
Kline, Donald
Fang, Liang
Melhem, Rami
Jones, Alex K.
Source :
Integration: The VLSI Journal. Jan2019, Vol. 64, p105-113. 9p.
Publication Year :
2019

Abstract

Abstract Phase change memory (PCM) is a promising alternative to conventional DRAM main memories, due to its read performance, density, and nonvolatility and resulting low static energy. Unfortunately, reliability is still a significant challenge as limited write endurance, exacerbated by process variation, leads to increasing numbers of stuck-at faults over the memory's lifetime. This includes a significant number of stuck-at faults that appear early in the memory's service. Error-correcting Pointers (ECP) is a popular proposal to mitigate stuck-at faults in PCM by recording the addresses and the values of faulty bits in order to extend the lifetime of the memory. We propose a method to extend the effectiveness of ECP coverage called Yoda, which utilizes a small number of additional encoding bits in order to dramatically improve the effectiveness and fault correction capability of ECP. By adding one additional bit to ECP which corrects f faults, Yoda can correct 2 f +1 faults. Further improvements are possible introducing small numbers additional bits. Our simulation results demonstrate that Yoda has a 3.0× improvement in fault coverage compared to a fault-aware ECP with a similar overhead, while also providing a 2.5–3.0× improvement over state-of-the-art schemes with comparable complexity. Furthermore, Yoda provides a method to protect the auxiliary bits, also with a small overhead. By adding one auxiliary bit to protect the auxiliary bits, Yoda can achieve extra improvement. Highlights • Extending pointers with partition and flip methods improve guaranteed correction capabilities. • Using small additional computational overhead decreases the number of required encoding bits. • Applying partition and flip to the auxiliary bits can allow them to operate reliably in faulty memory. • Yoda improves tolerated faults by 2.5–3.0× compared to state-of-the-art designs. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
01679260
Volume :
64
Database :
Academic Search Index
Journal :
Integration: The VLSI Journal
Publication Type :
Academic Journal
Accession number :
132991992
Full Text :
https://doi.org/10.1016/j.vlsi.2018.09.002