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Self-consistent procedure including envelope function normalization for full-zone Schrödinger-Poisson problems with transmitting boundary conditions.

Authors :
Verreck, Devin
Verhulst, Anne S.
Van de Put, Maarten L.
Sorée, Bart
Magnus, Wim
Collaert, Nadine
Mocuta, Anda
Groeseneken, Guido
Source :
Journal of Applied Physics. 2018, Vol. 124 Issue 20, pN.PAG-N.PAG. 9p. 5 Diagrams, 8 Graphs.
Publication Year :
2018

Abstract

In the quantum mechanical simulation of exploratory semiconductor devices, continuum methods based on a k ⋅ p/envelope function model have the potential to significantly reduce the computational burden compared to prevalent atomistic methods. However, full-zone k ⋅ p/envelope function simulation approaches are scarce and existing implementations are not self-consistent with the calculation of the electrostatic potential due to the lack of a stable procedure and a proper normalization of the multi-band envelope functions. Here, we therefore present a self-consistent procedure based on a full-zone spectral k ⋅ p/envelope function band structure model. First, we develop a proper normalization for the multi-band envelope functions in the presence of transmitting boundary conditions. This enables the calculation of the free carrier densities. Next, we construct a procedure to obtain self-consistency of the carrier densities with the electrostatic potential. This procedure is stabilized with an adaptive scheme that relies on the solution of Poisson's equation in the Gummel form, combined with successive underrelaxation. Finally, we apply our procedure to homostructure In 0.53 Ga 0.47 As tunnel field-effect transistors (TFETs) and staggered heterostructure GaAs 0.5 Sb 0.5 /In 0.53 Ga 0.47 As TFETs and show the importance of self-consistency on the device predictions for scaled dimensions. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
124
Issue :
20
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
133318004
Full Text :
https://doi.org/10.1063/1.5047087