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IGBT Open-Circuit Fault Diagnosis in a Quasi-Z-Source Inverter.
- Source :
-
IEEE Transactions on Industrial Electronics . Apr2019, Vol. 66 Issue 4, p2847-2856. 10p. - Publication Year :
- 2019
-
Abstract
- In this paper, a fast and practical method is proposed for open-circuit (OC) fault diagnosis (FD) in a three-phase quasi-Z-source inverter (q-ZSI). Compared with the existing fast OC FD techniques in three-phase voltage source inverters, this method is more cost-effective since no ultrafast processor or high-speed measurement is required. Additionally, the method is independent of the load condition. The proposed method is only applicable to Z-source family inverters and is based on observing the effect of shoot-through intervals on the system variables during switching periods. The proposed algorithm includes two consecutive stages: OC detection and fault location identification. When both stages of the OC FD algorithm are done, a redundant leg is activated and utilized instead of the failed leg. The accuracy of the proposed method is confirmed by the experimental results from a low-voltage q-ZSI prototype. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 02780046
- Volume :
- 66
- Issue :
- 4
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Industrial Electronics
- Publication Type :
- Academic Journal
- Accession number :
- 133482864
- Full Text :
- https://doi.org/10.1109/TIE.2018.2847709