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Feedback-Induced Failure of High-Power Diode Lasers.

Authors :
Leisher, Paul O.
Li, Chen
Jha, Aman Kumar
Pipe, Kevin P.
Helmrich, Jason D.
Thiagarajan, Prabhu
Boisselle, Matthew C.
Patra, Susant K.
Sezgin, Sezer
Deri, Robert J.
Source :
IEEE Journal of Quantum Electronics. Dec2018, Vol. 54 Issue 6, p1-13. 13p.
Publication Year :
2018

Abstract

Catastrophic failure of diode pumps in laser systems exhibiting back-irradiance is a common occurrence yet poorly understood. Prior paper has established boundaries for time-zero failures, but these results cannot be used to deduce safe back-irradiance levels for long-term reliable operation. In this paper, a framework to describe the impact of back-irradiance on the reliability of diode pumps is established. The root-cause of back-irradiance induced failure is identified as thermal in nature. The approach follows conventional reliability methodologies by treating the parameters of back-irradiance as stressors, which accelerate failures. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189197
Volume :
54
Issue :
6
Database :
Academic Search Index
Journal :
IEEE Journal of Quantum Electronics
Publication Type :
Academic Journal
Accession number :
133668197
Full Text :
https://doi.org/10.1109/JQE.2018.2873073