Characterization of a bent diamond used as dispersive spectrometer for XFEL applications.

MLA

Boesenberg, Ulrike, et al. “Characterization of a Bent Diamond Used as Dispersive Spectrometer for XFEL Applications.” AIP Conference Proceedings, vol. 2054, no. 1, Dec. 2018, pp. 060011-1-060011-5. EBSCOhost, https://doi.org/10.1063/1.5084642.

APA

Boesenberg, U., Samoylova, L., Roth, T., Sinn, H., Terentev, S., Blank, V., Rüffer, R., & Madsen, A. (2018). Characterization of a bent diamond used as dispersive spectrometer for XFEL applications. AIP Conference Proceedings, 2054(1), 060011-1-060011-5. https://doi.org/10.1063/1.5084642

Chicago

Boesenberg, Ulrike, Liubov Samoylova, Thomas Roth, Harald Sinn, Sergey Terentev, Vladimir Blank, Rudolf Rüffer, and Anders Madsen. 2018. “Characterization of a Bent Diamond Used as Dispersive Spectrometer for XFEL Applications.” AIP Conference Proceedings 2054 (1): 060011-1-060011-5. doi:10.1063/1.5084642.